FaN-REMs: Fair and Normalized Retrieval Evaluation Metrics for Learning Retrieval Systems
Cristin entry
https://app.cristin.no/results/show.jsf?id=2339458
ARKIV
https://hdl.handle.net/11250/3178303
FULLTEKST
https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10794782
DOI
Channel: IEEE Access
Journal name: IEEE Access
Published by: IEEE (Institute of Electrical and Electronics Engineers)
Publisher website: http://www.ieee.org/index.html
Page count: 26
Pages: 195370-195395